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INSTRUMENTS |
ACCESSORY AND SUPPORT INSTRUMENTS |
This scanning probe microscope is one of the first models marketed in the USA. It still has the capacity to perform imaging tasks that provide data on the texture of an object. The resolution is in the nanometer range and, depending on the specimen and the configuration of the probe will be higher or lower. There are several names by which these instruments have been called. The most recognizable is, Atomic Force Microscope (AFM).
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The X-Ray Diffractometer with the analytic and pattern-matching software that is present provides the investigator with the capability to determine the identity of crystalline minerals in a pulverized specimen. This instrument uses X-Rays of high energy and a very precise goniometer to scan the specimen for data. Automatic analysis includes peak determination, matching and statistical identification of minerals. ICDD card sets are also available for manual identification and confirmation of results.
This instrument has the capability to provide a vacuum environment (to 10-8 torr) for evaporation of carbon and/or metals (such as Au or Pt) for both conductive coatings of specimens or the production of metal shadow replicas of extremely small specimens or specimen surfaces. It also has the capacity to clean surfaces of contaminants that interfere with wetability.
Cressington sputter coater with thickness monitor (Au/Pd Target)
This device is designed to substitute liquid carbon dioxide at low temperature for acetone or alcohol so that drying of the specimen can be accomplished at higher temperature and pressure via the rapid phase transition of the liquid CO2 to gas. This process is used for dehydrating or drying any specimen whose microstructure can be altered or destroyed during normal evaporative drying of water or other liquids.
